Local film thickness and photoresponse o
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M. Kozlowski; W.H. Smyrl; Lj. Atanasoska; R. Atanasoski
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Article
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1989
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Elsevier Science
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English
⚖ 1009 KB
Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obta