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Atomic Layer Deposition of Photocatalytic TiO2 Thin Films from Titanium Tetramethoxide and Water

✍ Scribed by V. Pore; A. Rahtu; M. Leskelä; M. Ritala; T. Sajavaara; J. Keinonen


Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
268 KB
Volume
10
Category
Article
ISSN
0948-1907

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## Abstract HfO~2~ films were grown by atomic layer deposition (ALD) from a new liquid precursor, Hf(ONEt~2~)~4~ and H~2~O, at temperatures between 250 °C and 350 °C on borosilicate glass and Si(100) substrates. The highest growth rate was achieved at 300 °C, whereas the growth was essentially slow