𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Reliability of Contacts for Press-Pack High-Power Devices

✍ Scribed by J. Vobecký; D. Kolesnikov


Book ID
108210583
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
945 KB
Volume
45
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Low resistivity ohmic contacts on 4H-sil
✍ S.-K Lee; C.-M Zetterling; M Östling; J.-P Palmquist; U Jansson 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 233 KB

We investigated titanium based ohmic contacts using co-evaporated epitaxial titanium carbide (TiC) on highly 1 1 doped n -and p -type epilayers as well as Al ion implanted layers for high power and high temperature device application. Epitaxially grown TiC ohmic contacts on epilayers as well as Al i