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Reliability improvement with new passivation of solid encapsulated transistors : E. A. Herr. 10th IEEE Annual Proceedings, Reliability Physics 1972, p. 69

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 110 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90611-2

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