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Reliability improvement of wire bonds subjected to fatigue stresses : K. V. Ravi and E. M. Philofsky. 10th IEEE Annual Proceedings Reliability Physics 1972 p. 143

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 114 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90619-7

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