𝔖 Bobbio Scriptorium

✦ LIBER ✦

Environmental factors governing field reliability of plastic transistors and integrated circuits : B. Reich and E. B. Hakim. 10th IEEE Annual Proceedings, Reliability Physics (1972), p. 82

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 218 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90366-1

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A reliability study of insulated gate fi

A reliability study of insulated gate field effect transistors with an Al2O3-SiO2 gate structure : E. E. Lampi and E. F. Labuda. 10th IEEE Annual Proceedings, Reliability Physics (1972), p. 112

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 114 KB

Prediction of IC and LSI performance by

Prediction of IC and LSI performance by specialized vibration/detection test for presence of conductive particles : B. T. French and J. E. Mann. 10th IEEE Annual Proceedings, Reliability Physics 1972, p. 26

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 113 KB