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Reliability evaluation of class-E and class-a power amplifiers with nanoscaled CMOS technology

✍ Scribed by Wei-Cheng Lin; Tsung-Chien Wu; Yi-Hung Tsai; Long-Jei Du; Ya-Chin King

Book ID: 114617869
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 565 KB
Volume: 52
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.850639

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