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Reliability assessment on new reprogrammable non-volatile memory devices based on SiCr–O

✍ Scribed by Yuan Li; Romain Delangle; Xiao-mei Zhang; Bart Hovens


Book ID
113800568
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
705 KB
Volume
51
Category
Article
ISSN
0026-2714

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