✦ LIBER ✦
Non volatile memory reliability evaluation based on oxide defect generation rate during stress and retention test
✍ Scribed by Aziza, H.; Portal, J.M.; Plantier, J.; Reliaud, C.; Regnier, A.; Ogier, J.L.
- Book ID
- 119373488
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 710 KB
- Volume
- 78
- Category
- Article
- ISSN
- 0038-1101
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