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Relationship between high resistivity and the deep level defects in CZT:In

โœ Scribed by Nan, Ruihua; Jie, Wanqi; Zha, Gangqiang; Yu, Hui


Book ID
120937903
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
528 KB
Volume
705
Category
Article
ISSN
0168-9002

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