✦ LIBER ✦
Sensitivity of on-resistance and threshold voltage to buffer-related deep level defects in AlGaN/GaN high electron mobility transistors
✍ Scribed by Armstrong, Andrew M; Allerman, Andrew A; Baca, Albert G; Sanchez, Carlos A
- Book ID
- 120486121
- Publisher
- Institute of Physics
- Year
- 2013
- Tongue
- English
- Weight
- 396 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0268-1242
No coin nor oath required. For personal study only.