๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Relationship between film quality and deposition rate for a-Si:H by ECR plasma CVD

โœ Scribed by M. Zhang; Y. Nakayama; S. Nonoyama; K. Wakita


Book ID
115988945
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
300 KB
Volume
164-166
Category
Article
ISSN
0022-3093

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES