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Reflectance and photoreflectance for in-situ monitoring of the molecular beam epitaxial growth of CdTe and Hg-based materials

✍ Scribed by Zhonghai Yu; M. A. Mattson; T. H. Myers; K. A. Harris; R. W. Yanka; L. M. Mohnkern; L. C. Lew Yan Voon; L. R. Ram-Mohan; R. G. Benz; B. K. Wagner; C. J. SummersBenz

Book ID: 112816310
Publisher: Springer US
Year: 1995
Tongue: English
Weight: 622 KB
Volume: 24
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02657979

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