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In situ monitoring of reflection high-energy electron diffraction oscillation during the growth of gallium nitride films by gas-source molecular beam epitaxy

✍ Scribed by Yoshitaka Moriyasu; Hiromasa Goto; Naohiro Kuze; Masahiro Matsui


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
333 KB
Volume
150
Category
Article
ISSN
0022-0248

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