Simultaneous reflection high-energy electron diffraction oscillations and mass spectroscopy investigations during molecular beam epitaxy growth of (001) GaAs - smooth surfaces or stoichiometric films?

✍ Scribed by Ch. Heyn; M. Harsdorff

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 468 KB
• Volume: 150
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(95)80192-f