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Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation

✍ Scribed by Beckhoff, Burkhard; Fliegauf, Rolf; Kolbe, Michael; Müller, Matthias; Weser, Jan; Ulm, Gerhard


Book ID
111869079
Publisher
American Chemical Society
Year
2007
Tongue
English
Weight
875 KB
Volume
79
Category
Article
ISSN
0003-2700

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