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Reduction of cracks in GaN films grown on Si-on-insulator by lateral confined epitaxy

✍ Scribed by S. Zamir; B. Meyler; J. Salzman


Book ID
108341694
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
146 KB
Volume
243
Category
Article
ISSN
0022-0248

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