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RBS, XRR and optical reflectivity measurements of Ti–TiO2 thin films deposited by magnetron sputtering

✍ Scribed by K. Drogowska; Z. Tarnawski; A. Brudnik; E. Kusior; M. Sokołowski; K. Zakrzewska; A. Reszka; N.- T.H. Kim-Ngan; A.G. Balogh

Book ID
113787514
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
807 KB
Volume
47
Category
Article
ISSN
0025-5408

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