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RBS analysis of beam-processed microarea by focused MeV ion beam

✍ Scribed by A. Kinomura; M. Takai; T. Matsuo; S. Ujiie; S. Namba; M. Satou; M. Kiuchi; K. Fujii; T. Shiokawa

Book ID
113280134
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
382 KB
Volume
39
Category
Article
ISSN
0168-583X

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