✦ LIBER ✦

Rapid thermal process-induced defects in silicon position detectors

✍ Scribed by M. Alietti; F. Nava; R. Tonini; P. Cantoni; L. Stagni; A. Cavallini

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Annealing kinetics during rapid thermal

✍ B. Hartiti; A. Slaoui; J.C. Muller; P. Siffert 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 318 KB

Rapid thermal process-induced recombinat

✍ W. Eichhammer; M. Hage-Ali; R. Stuck; P. Siffert 📂 Article 📅 1990 🏛 Springer 🌐 English ⚖ 531 KB

Spatial distributions of induced traps i

✍ Y. Tokuda; N. Kobayashi; A. Usami; Y. Inoue; M. Imura 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 470 KB

Process-Induced Morphological Defects in

✍ J. A. Powell; D. J. Larkin 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 647 KB

Light-induced defects in thermal anneale

✍ J. Serra; J. Bertomeu; G. Sardin; C. Roch; J.M. Asensi; J. Andreu; J.L. Morenza 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 409 KB

Studies of metal-induced surface defects

✍ S. Hahn; W.L. Smith; H. Suga; R. Meinecke; R.R. Kola; G.A. Rozgonyi 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 1021 KB