𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Random dopant induced threshold voltage lowering and fluctuations in sub 50 nm MOSFETs: a statistical 3D `atomistic' simulation study

✍ Scribed by Asenov, Asen


Book ID
120582379
Publisher
Institute of Physics
Year
1999
Tongue
English
Weight
360 KB
Volume
10
Category
Article
ISSN
0957-4484

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES