A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating, in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this techniq
β¦ LIBER β¦
Raman spectroscopic and X-ray diffraction studies of electrode-solution interfaces
β Scribed by M. Fleischmann; P. Graves; I. Hill; A. Oliver; J. Robinson
- Book ID
- 108343651
- Publisher
- Elsevier Science
- Year
- 1983
- Weight
- 474 KB
- Volume
- 150
- Category
- Article
- ISSN
- 0022-0728
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
In Situ X-ray diffraction studies of ele
β
M. Fleischmann; A. Oliver; J. Robinson
π
Article
π
1986
π
Elsevier Science
π
English
β 684 KB
In-situ X-ray diffraction studies of Pt
β
M. Fleischmann; B.W. Mao
π
Article
π
1987
π
Elsevier Science
β 973 KB
Characterization of porous titania glass
β
Yee Hong Chee; R. P. Cooney; R. F. Howe; P. A. W. van der Heide
π
Article
π
1992
π
John Wiley and Sons
π
English
β 518 KB
Raman spectroscopy and X-ray diffraction
β
Yen-Hua Chen; Shu-Cheng Yu; Eugene Huang; Pei-Lun Lee
π
Article
π
2010
π
Elsevier Science
π
English
β 231 KB
X-ray photoelectron spectroscopic (XPS)
β
P.M.A. Sherwood
π
Article
π
1980
π
Elsevier Science
β 56 KB
Raman spectroscopic studies of ZnSe/GaAs
β
T. A. El-Brolossy; H. Talaat
π
Article
π
2007
π
John Wiley and Sons
π
English
β 128 KB
## Abstract ZnSe/semiβinsulating GaAs interfaces were studied by observing photogenerated plasmonβLO (PPL) coupled modes by nonresonant microβRaman spectroscopy. The effect of the carriers generated by the focused laser beam was investigated for a series of different thicknesses of ZnSe epitaxial l