Raman scattering study of a GaAsN epitaxial layer
β Scribed by G.Y. Yu; Z.X. Shen; L. Liu; W.X. Sun
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 111 KB
- Volume
- 4
- Category
- Article
- ISSN
- 1369-8001
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β¦ Synopsis
Raman scattering study of a dilute GaAsN epitaxy layer was carried out at variable temperature and pressure. The localization due to the presence of the N atoms is responsible for the small correlation length in the GaAsN alloy, which is also evident from the broadening and asymmetry of the LO mode of the GaAs-like Raman band. The temperature dependence of the correlation length was analyzed. Nitrogen-induced localization also has a strong influence on the pressure dependence of the Born's effective dynamic charge e Γ:
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