✦ LIBER ✦

Raman Scattering Characterization of Polytype in Silicon Carbide Ceramics: Comparison with X-ray Diffraction

✍ Scribed by Shin-ichi Nakashima; Makoto Higashihira; Kouji Maeda; Hidehiko Tanaka

Book ID: 108575568
Publisher: John Wiley and Sons
Year: 2003
Tongue: English
Weight: 141 KB
Volume: 86
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.2003.tb03382.x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of silicon carbide surf

Characterization of silicon carbide surfaces of 6H-, 15R- and 3C-polytypes by optical second-harmonic generation in comparison with X-ray diffraction techniques

✍ C. Jordan; H. Schillinger; L. Dressler; S. Karmann; W. Richter; K. Goetz; G. Mar 📂 Article 📅 1997 🏛 Springer 🌐 English ⚖ 913 KB

Characterization of macrodefects in pure

Characterization of macrodefects in pure silcon carbide films using X-ray topography and Raman scattering

✍ A. M. Danishevskii; A. S. Tregubova; A. A. Lebedev 📂 Article 📅 1997 🏛 Springer 🌐 English ⚖ 308 KB

Characterization of phases formed in the

Characterization of phases formed in the iron carbide process by X-ray diffraction, mossbauer, X-ray photoelectron spectroscopy, and raman spectroscopy analyses

✍ Eungyeul Park; Oleg Ostrovski; Jianqiang Zhang; Stuart Thomson; Russell Howe 📂 Article 📅 2001 🏛 The Minerals, Metals & Materials Society 🌐 English ⚖ 242 KB

Comparison of light-scattering with X-ra

Comparison of light-scattering with X-ray diffraction data on spherulite deformation in polyethylene films

✍ B.M Ginzburg; D Rashidov; I.T Moneva 📂 Article 📅 1981 🏛 Elsevier Science ⚖ 442 KB

Characterization of Lattice Damage in Io

Characterization of Lattice Damage in Ion Implanted Silicon: Monte Carlo Simulation Combined with Double Crystal X-Ray Diffraction

✍ Cembali, F. ;Mazzone, A. M. ;Servidori, M. 📂 Article 📅 1985 🏛 John Wiley and Sons 🌐 English ⚖ 154 KB

Characterization of the InN conversion l

Characterization of the InN conversion layer in InP surface by ammonia gas: Nuclear reaction analysis, X-ray diffraction and Raman scattering studies

✍ Y. Mizuki; A. Onoue; K. Kuriyama; M. Hasegawa; I. Sakamoto 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 162 KB