Characterization of macrodefects in pure silcon carbide films using X-ray topography and Raman scattering

✍ Scribed by A. M. Danishevskii; A. S. Tregubova; A. A. Lebedev

• Book ID: 110119486
• Publisher: Springer
• Year: 1997
• Tongue: English
• Weight: 308 KB
• Volume: 31
• Category: Article
• ISSN: 1063-7826
• DOI: 10.1134/1.1187018