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Characterization of sputtered films of Tl2Ba2CaCu2O8 using Raman scattering and x-ray diffraction

✍ Scribed by J. Chrzanowski; J.C. Irwin; B. Heinrich; A.E. Curzon; N. Fortier; A. Cragg

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 860 KB
Volume: 182
Category: Article
ISSN: 0921-4534
DOI: 10.1016/0921-4534(91)90517-3

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