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Raman scattering characterization of Ge-composition in bulk Si1−xGexwith compositional variation

✍ Scribed by M. R. Islam; M. Yamada

Book ID: 106397984
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 424 KB
Volume: 19
Category: Article
ISSN: 0957-4522
DOI: 10.1007/s10854-007-9514-z

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