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Raman characterization and stress analysis of AlN:Er3+ epilayers grown on sapphire and silicon substrates

✍ Scribed by Kallel, T.; Dammak, M.; Wang, J.; Jadwisienczak, W.M.

Book ID: 121834205
Publisher: Elsevier Science
Year: 2014
Tongue: English
Weight: 925 KB
Volume: 187
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2014.04.003

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