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Radiation induced defects in CVD-grown 3C-SiC

✍ Scribed by Itoh, H.; Yoshikawa, M.; Nashiyama, I.; Misawa, S.; Okumura, H.; Yoshida, S.

Book ID
111950772
Publisher
IEEE
Year
1990
Tongue
English
Weight
659 KB
Volume
37
Category
Article
ISSN
0018-9499

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