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Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)

✍ Scribed by R. M. Kemper; M. Häberlen; T. Schupp; M. Weinl; M. Bürger; M. Ruth; C. Meier; T. Niendorf; H. J. Maier; K. Lischka; D. J. As; J. K. N. Lindner

Book ID
112182193
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
829 KB
Volume
9
Category
Article
ISSN
1862-6351

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