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Radiation damage of Ge-on-Si devices

✍ Scribed by H. Ohyama; K. Sakamoto; H. Sukizaki; K. Takakura; K. Hayama; M. Motoki; K. Matsuo; H. Nakamura; M. Sawada; M. Midorikawa; S. Kuboyama; B. De Jaeger; E. Simoen; C. Claeys

Book ID: 103846646
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 300 KB
Volume: 11
Category: Article
ISSN: 1369-8001
DOI: 10.1016/j.mssp.2008.08.001

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