𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Quantitative texture and defect analysis of polycrystalline diamond films by ion channeling

✍ Scribed by R. Samlenski; R. Brenn


Book ID
113285368
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
591 KB
Volume
86
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Quantitative analysis of binary adsorbed
✍ Wagner, M. S. ;Shen, M. ;Horbett, T. A. ;Castner, David G. πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 150 KB

## Abstract Time of flight secondary ion mass spectrometry (ToF‐SIMS) is an ideal technique for the analysis of adsorbed protein films because of its surface sensitivity and chemical specificity. In this study, we examined ToF‐SIMS with the multivariate calibration method partial least squares regr