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Defect analysis of epitaxial Ag films on silicon by MeV ion channeling

✍ Scribed by G.A. Smith; K.-H. Park; G.-C. Wang; T.-M. Lu; W.M. Gibson

Book ID: 118363352
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 725 KB
Volume: 233
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(90)90182-8

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