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Epitaxial growth analysis of YBaCuO thin films by ion backscattering and channeling spectrometry

โœ Scribed by O. Meyer; J. Geerk; Q. Li; G. Linker; X.X. Xi

Book ID
113281282
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
564 KB
Volume
45
Category
Article
ISSN
0168-583X

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Characterization of epitaxial group II f
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โœ Dr. R. Flagmeyer; Dr. B. Schumann ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 539 KB

Lattice matched (Ca, Sr)F, and related fluoride films grown on (100)GaAs substrates were investigated by Rutherford backscattering/Channeling. This technique allows the characterization of the 30-250 nm thick heteroepitaxial layers with respect to chemical composition, film thickness, interface roug