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Quantitative distribution analysis of dopant elements in silicon with SIMS for the improvement of process modelling

✍ Scribed by G. Stingeder; M. Grasserbauer; E. Guerrero; H. Pötzl; R. Tielert


Book ID
111688113
Publisher
Springer
Year
1983
Tongue
English
Weight
396 KB
Volume
314
Category
Article
ISSN
1618-2650

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