𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Quantitative Depth Profiling of K-Doped Fullerene Films Using XPS and SIMS

✍ Scribed by Oswald, Steffen ;Janda, Pavel ;Dunsch, Lothar

Publisher
Springer-Verlag
Year
2003
Weight
174 KB
Volume
141
Category
Article
ISSN
0344-838X

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

SIMS depth profiling of TiOxNy films
SIMS depth profiling of TiOxNy films
✍ Metson, J. B.; Prince, K. E. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 112 KB πŸ‘ 1 views

Amorphous TiO x N y films of varying stoichiometry have been deposited on Si and Cu substrates using ionassisted deposition (IAD). The structure of the films and the effects of annealing in the 200-450 Β°C range have been examined. Secondary ion mass spectrometry (SIMS) has been used to investigate

SIMS Depth Profiling of Delta-doped Laye
SIMS Depth Profiling of Delta-doped Layers in Silicon
✍ Smirnov, V. K.; Simakin, S. G.; Potapov, E. V.; Makarov, V. V. πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 723 KB

Boron and germanium 6-doped silicon samples were studied using SIMS depth profiling on a Cameca IMS-4F instrument with O,', N z + and Cs' primary beams at various energies and incidence angles. The depth resolution characteristics were compared. We show that, with experimental conditions being the s

Characterization of titanium hydride fil
Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis
✍ Lisowski, W.; van den Berg, A. H. J.; Leonard, D.; Mathieu, H. J. πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 98 KB πŸ‘ 2 views

Thin titanium hydride (TiH y ) films, covered by ultrathin gold layers, have been compared with the corresponding titanium films after analysis using a combination of time-of-flight SIMS (ToF-SIMS), XPS and AES. The TiH y layers were prepared under UHV conditions by precisely controlled hydrogen sor