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Quantitative depth profile analysis of high-Tc-superconductors with sputtered neutral mass spectrometry (SNMS)

✍ Scribed by H. Peters; L. Skoda; G. Crecelius; H. Adrian

Book ID: 112376579
Publisher: Springer
Year: 1989
Tongue: English
Weight: 260 KB
Volume: 333
Category: Article
ISSN: 1618-2650
DOI: 10.1007/bf00572324

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