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Depth profile and quantitative trace element analysis of diffusion aluminided type layers on Ni-base superalloys using high-resolution glow-discharge mass spectrometry

✍ Scribed by Irene T Spitsberg; Karol Putyera


Book ID
108422849
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
775 KB
Volume
139
Category
Article
ISSN
0257-8972

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