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Quantitative Analysis of Ti-Si-Ge/Si-Ge/Si Structures by EDS and AES

✍ Scribed by Berner, Alexander I. ;Beregovsky, Michael Y. ;Eizenberg, Moshe M.

Book ID: 113051005
Publisher: Springer-Verlag
Year: 2000
Weight: 99 KB
Volume: 132
Category: Article
ISSN: 0344-838X
DOI: 10.1007/s006040050095

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