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Quantitative Analysis of Thin Aluminium-Oxynitride Films by EPMA

โœ Scribed by Dreer, Sabine ;Wilhartitz, Peter ;Mersdorf, Edgar ;Piplits, Kurt ;Friedbacher, Gernot


Book ID
105747066
Publisher
Springer-Verlag
Year
1999
Weight
224 KB
Volume
131
Category
Article
ISSN
0344-838X

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A systematic database of thin-film measurements on aluminum films by electron probe microanalysis is presented. The measurements were performed between 3 and 30 kV accelerating voltage on films of six different nominal thicknesses, ranging from 100 up to 3200 ร…, which were deposited simultaneously o