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Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GD-OES and FT-IR

✍ Scribed by S. Dreer


Book ID
105897783
Publisher
Springer
Year
1999
Tongue
English
Weight
379 KB
Volume
365
Category
Article
ISSN
1618-2650

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