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Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector

✍ Scribed by Baker, Jessy L.; Jimison, Leslie H.; Mannsfeld, Stefan; Volkman, Steven; Yin, Shong; Subramanian, Vivek; Salleo, Alberto; Alivisatos, A. Paul; Toney, Michael F.

Book ID: 118124925
Publisher: American Chemical Society
Year: 2010
Tongue: English
Weight: 810 KB
Volume: 26
Category: Article
ISSN: 0743-7463
DOI: 10.1021/la904840q

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