Characterization of strain relaxation of (0 0 1) oriented SrTiO3 thin films grown on LaAIO3 (1 1 0) by means of reciprocal space mapping using x-ray diffraction

✍ Scribed by C. N. L. Edvardsson; J. Birch; U. Helmersson

• Book ID: 110271965
• Publisher: Springer US
• Year: 1999
• Tongue: English
• Weight: 126 KB
• Volume: 10
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1023/a:1008995912702