X-ray microanalysis of organic thin sections in TEM using an UTW Si(Li) detector: Comparison of quantification methods

✍ Scribed by Patrice Laquerriere; Vincent Banchet; Jean Michel; Karl Zierold; Gérard Balossier; Pierre Bonhomme

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 143 KB
• Volume: 52
• Category: Article
• ISSN: 1059-910X
• DOI: 10.1002/1097-0029(20010115)52:2<231::aid-jemt1008>3.0.co;2-f