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Quality of the Oxidation Interface of AlGaN in Enhancement-Mode AlGaN/GaN High-Electron Mobility Transistors

✍ Scribed by Chiu, Hsien-Chin; Yang, Chih-Wei; Chen, Chao-Hung; Wu, Chia-Hsuan


Book ID
120041649
Publisher
IEEE
Year
2012
Tongue
English
Weight
644 KB
Volume
59
Category
Article
ISSN
0018-9383

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