Pt/Ga/C and Pt/C composite nanowires fabricated by focused ion and electron beam induced deposition

✍ Scribed by Li, P. G. ;Jin, A. Z. ;Tang, W. H.

• Book ID: 105363427
• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 320 KB
• Volume: 203
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200521292

✦ Synopsis

Abstract

Pt/Ga/C and Pt/C composite nanowires have been fabricated using ion beam induced deposition (IBID) and electron beam induced deposition (EBID), respectively, with a dual beam focused ion beam system. The Pt/Ga/C composite nanowires usually exhibit a semiconducting character and their resistances increase greatly as the temperature decreases. However, the Pt/C composite nanowires show metallic behaviour above 2 K. The results suggest that EBID is more suitable than IBID for fabricating measuring electrodes for nanomaterials and devices in a single‐step process. It has also been found that the resistance of the Pt/C nanowires decreases abruptly around 20 K, which could arise from a possible new phase formed between Pt and C. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)