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Microstructure and Composition of Focused-Ion-Beam-Deposited Pt Contacts to GaN Nanowires

✍ Scribed by D. Tham; C.-Y. Nam; J. E. Fischer


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
272 KB
Volume
18
Category
Article
ISSN
0935-9648

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The chemical composition and microstructure of dual ion beam-deposited Ðlms with nitrogen contents in the CN x range 20-33 at.% have been examined by Fourier transform infrared spectroscopy (FTIR) and x-ray photoelectron spectroscopy (XPS). The FTIR spectra together with other published data have be