We compare the ability of three different equivalent-circuit extraction methods to give ensembles of model parameters that accurately predict not only average S-parameters but the S-parameter statistics, i.e., the standard deviations and intercorrelations between the real and imaginary parts. Measur
β¦ LIBER β¦
Protocol-dependence of equivalent circuit parameters
β Scribed by R. F. Husted; A. Essig; D. Wolff
- Publisher
- Springer
- Year
- 1981
- Tongue
- English
- Weight
- 129 KB
- Volume
- 62
- Category
- Article
- ISSN
- 0022-2631
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