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Properties of vacancies and self-interstitials in silicon deduced from crystal growth, wafer processing, self-diffusion and metal diffusion

✍ Scribed by V.V. Voronkov; R. Falster


Book ID
108215393
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
168 KB
Volume
134
Category
Article
ISSN
0921-5107

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