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On the Properties of the Intrinsic Point Defects in Silicon: A Perspective from Crystal Growth and Wafer Processing

✍ Scribed by R. Falster; V.V. Voronkov; F. Quast


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
393 KB
Volume
222
Category
Article
ISSN
0370-1972

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